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Showing results: 121 - 135 of 157 items found.

  • Modulation Distortion Up To 43.5 GHz

    S930704B - Keysight Technologies

    S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To And Beyond 125 GHz

    S930713B - Keysight Technologies

    S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Production and Laboratory OTDR

    8000 - Photon Kinetics

    The 8000 OTDR is the first of a new generation of OTDRs that has been designed specifically for optical fiber and cable test applications. Its revolutionary "performance first" optical design delivers unsurpassed optical performance, and its MS Windows operating system facilitates integration of the OTDR into manufacturing networks. These features, combined with unique data acquisition capabilities, significantly reduce the time associated with many aspects of the OTDR measurement process, making it possible for fiber and cable manufacturers to increase production output and reduce manufacturing costs.

  • Software AndSoftware Drivers

    Advanced Power Designs, Inc.

    Advanced Power Designs is the first to introduce programmable DC power supplies on dual C-Size VXI card formats. Designed specifically for easy integration into new VXI automatic test systems, these state-of-the-art power supplies are fully compliant with all VXI specifications for direct installation into any standard C-Size VXI card cage. They can even be purchased with LABVIEW, LABWINDOWS, CVI or HPVEE Graphical User Interfaces*, and a fully integrated command and control software program written for the National Instruments MXI I/O. protocol.

  • Line Scan Camera

    Piranha4 - Teledyne DALSA

    The Piranha4 cameras offer advanced features such as sub-pixel spatial correction, areas of interest (up to 4 at a time) to reduce data processing and simplify cabling, as well as dual-line area mode to double line rate, HDR mode, shading and lens correction. The Piranha4 is built for the real world with features to ease system integration. The advanced GenICam compliant user interface makes it easy to set up and control camera parameters such as exposure control, FFC, white balance, gain, test patterns, diagnostics and more.

  • MPI SiPH Probe Systems

    MPI Advanced Semiconductor Test

    MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE

  • Analog

    Microchip Technology Inc.

    Create complete systems while streamlining your development process and reducing your design risk. We design our mixed-signal, linear, interface and power products for seamless integration with our extensive portfolio of microcontrollers, digital signal controllers, microprocessors and FPGAs. Well-known for our thorough documentation, we provide parts that work on the bench the same way they’re described on paper. We also provide evaluation boards to demonstrate functionality, an intuitive Integrated Development Environment (IDE), simulation software and other design resources to create a rapid design, prototype and test environment for all aspects of your system design.

  • 6TL36 Plus In-line Test Handler w/Bypass

    EA923 - 6TL Engineering

    - Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE

  • Loaded Spectrophotometer

    DSCD-900 - Lisun Electronics Inc.

    DSCD-900 is a highly performance spectrophotometer with test caliber upward. The instrument adopts the geometric conditions of D/8 lighting and observation of CIE recommendations, integration of the full band LED composite light source, double beam optical system, ETC every-time calibration technology, spectral reflectance standard deviation within 0.08, maximum of colorimetric values ΔE*ab is 0.03, to provide all the necessary color formula. It could be widely used for coating, printing, textile, meet plastic, food, medicine, automobile field to meet customers’ measurement requirement.

  • Industrial Vibration Sensor

    IVS-500 - Polytec GmbH

    The new IVS-500 Industrial Vibration Sensor is the key to fast acoustic quality inspection, structure-borne noise analysis and reliable pass-fail decisions. This Laser sensor measures reliably, in demanding industrial environments, without contact and therefore without wear and on virtually all surfaces. Costs and yields are therefore optimized by reducing false rejects in the production and assembly process. The simple setup and ruggedized sensor design of the IVS-500 enable a smooth integration into production test systems. Complemented with the software tool QuickCheck, Polytec offers a comprehensive solution for reliable pass/fail analysis.

  • USB Modular Products Chassis

    U2781A - Keysight Technologies

    The Keysight U2781A USB modular instrument chassis is a high-performance 4U high chassis that comes with a 200 W universal AC power supply and a built-in protection circuit. This portable chassis can house up to six Keysight USB modular products. The U2781A targets a wide range of applications in both industrial and scientific environments in the research and development (R&D), design-validation, and manufacturing fields. The primary advantage of this chassis is its synchronization capability between modules. This can help you to lower your cost of testing and accelerate your test system integration and development.

  • I2C Serial Bus Protocol Analyzers and Exercisers

    Corelis, Inc.

    Corelis offers the BusPro-I™ and CAS-1000-I2C™ bus analyzer products to satisfy different technical needs and price points. Corelis bus analyzers and exercisers offer analysis, test, and debug capabilities for product development, system integration, and manufacturing of digital boards and systems. All of our bus analyzers are PC-based and come with a Windows-based software package.Both the BusPro-I and the CAS-1000-I2C/E are equipped with I2C Exerciser, a highly intuitive software package that lets you get the most from your I2C bus analyzer. Each is packaged in an attractive, integrated enclosure, for optimal bench-top and test floor convenience.

  • Automated Test Equipment

    ATE - Frontier Electronic Systems Corp.

    The design, development, manufacture and integration of Automated Test Equipment (ATE) systems is a core technology focus for FES. Our engineers have designed and manufactured complex flight line test systems for military aircraft such as the F-15, F-18, C-17, B-1, B-52 and OV-22 aircraft. In 1994, FES developed the Common Core Test Set to test space systems electronics for the Defense Support Program (DSP). This open-architecture, high-reliability electronics test set has been upgraded over the last 20 years with new hardware and graphics-based software to accommodate the complex testing requirements associated with the International Space Station Rotary Joint Motor Controller and other satellite electronics. Maritime ATE systems designed and manufactured by FES include Radar & Video Distribution factory test systems supporting US and Canadian Navy customer production requirements. Core components of FES-developed ATE systems include the use of PXI/PCI/VXI/VME technologies, National Instruments Test Stand software, Agilent Technologies instrumentation, and Virginia Panel interface hardware. The FES ATE design team employs CMMI level 3 compliant processes throughout the design process from Systems Requirements Analysis through verification and validation of ATE compliance with customer hardware, software, and documentation requirements.

  • Packaging Manufacturing

    KLA-Tencor Corp

    KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.

  • Surge Tester with Performance Tests

    MEA MSU100 - MOTOMEA

    *MEA MSU100 Series – Fully automatic SURGE testing of 3 phase and single phase stators, armatures, transformers, and motors, ranging from 10 W to 500 kW, and patented Stator/Rotor performance testing.*MEA MSU101 Series – Customized, fully automatic production line testing system with SURGE testing of 3 phase or single phase stators, armatures, transformers, and motors, ranging from 10 W to 500 kW. The system can be also equipped with automatic testing of H.V. and 4-wire resistance, temperature, and patented Stator/Rotor performance testing.*PERFORMANCE TESTING – MEA patented tests – MEA patented performance testing provides fully automatic Stator/Rotor performance tests, showing the UUT performance as it will be after assembled as motor.*Integrated database.*200 V up to 5 kV programmable impulse.*Option for Partial/Low-Energy Discharge.*Go/No Go tests with comparison detection of: Area Size, Diff Zone, Corona Amount, and Corona Number.*Performances tests comparison at cold and hot state (temperature tests via up to 8 thermocouples).*Interfaces: RS-232, USB, Ethernet (for remote control).*Can be controlled via I/O for OEM applications and easy integration for automatic lines.*Special self-calibration function. No need to send back for the vendor's calibration, saving time and costs.*MSU101 integrated and operated with PC having user-friendly Windows 7 interface, with large database for storing test programs and test results.*Barcode reader, individual print-out of test protocols and labels, of H.V. and 4-wire resistance, and temperature measurement can be integrated into the system.

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